取15 mg 0.14% Pt/o-SnO2-ALD样品粉末和溴化钾压片，将样品装填至原位反应池内，在25 ml min-1的纯Ar气氛下升温至200 ℃，预处理1 h后降至室温，抽真空至0.5 Pa后测试红外数据作为基底背景扣除。将4.2% FA/Ar反应气引入原位红外池，并以10 ℃ min-1的速率升至160 ℃，反应1 h后，切换至纯Ar气氛吹扫30 min测试红外数据；抽真空后再测试红外数据。采集到的图谱经扣除背景及9-point平滑处理。

15 mg 0.14% Pt/o-SnO2-ALD sample powder and potassium bromide tablet were taken, and the sample was loaded into the in-situ reaction tank. The sample was heated to 200 ℃ in a pure Ar atmosphere of 25 ml min-1. After pretreatment for 1 h, the temperature was lowered to room temperature.  The 4.2% FA/Ar reaction gas was introduced into the in-situ infrared cell and increased to 160 ℃ at the rate of 10 ℃ min-1. After reaction for 1 h, the pure Ar atmosphere was switched to purge for 30 min to test the infrared data.  Test infrared data after vacuuming.  The collected maps were processed by background deduction and 9-point smoothing.