以纳米SiC、超细W粉为原料，经球磨混合、成形、1760℃~1920℃烧结制备出不同SiC含量的钨合金。采用透射电子显微镜(TEM, JEM-2100F)分析粉体的形貌。采用x射线衍射(XRD, D/max2550，Cu-Ka辐射)检测合金的物相组成。采用扫描电子显微镜(SEM, JSM-6360LV)对断口形貌和显微组织进行分析，采用EDX对选定成分或定点成分进行分析。元素分布和相采用电子探针显微分析(EPMA, JXA-8530F）分析材料的组成。采用电子背散射衍射(EBSD, Helios Nanolab 600i）表征钨晶粒分布组成。

Tungsten alloys with different SiC contents were prepared from nano-SiC and ultrafine W powders by ball-mill mixing, forming, and sintering at 1760℃~1920℃. Transmission electron microscopy (TEM, JEM-2100F) was used to analyze the morphology of the powders. The physical phase composition of the alloys was examined by x-ray diffraction (XRD, D/max2550, Cu-Ka radiation). Scanning electron microscopy (SEM, JSM-6360LV) was used to analyze the fracture morphology and microstructure, and EDX was used to analyze selected compositions or fixed-point compositions. Elemental distribution and phases were analyzed by electron probe microanalysis (EPMA, JXA-8530F) to analyze the composition of the material. The tungsten grain distribution composition was characterized by electron backscatter diffraction (EBSD, Helios Nanolab 600i).